Industry and Applications

Deposition of interference coatings by electron beam evaporation and spectrophotometric measurement of spectral reflectance and transmittance

Thin layer coatings are prepared by means of electron beam evaporation using a Balzers BAK550 coater equipped with two electron guns. Substrates can be preheated. Our coater is capable of small batch production of circular substrates with the largest diameter of 180mm or rectangles up to 170mm x 120mm.

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Measurement of localmass-thickness of thin samples and mass of individual

The calibrated scanning electronmicroscope (SEM) can be used also for quantitative imaging. Provided that SEMis equippedwith a very sensitive annular dark-field (ADF) detector, its signal can be simulated by the Monte Carlo method and, thus, can be used for measurements of the following parameters:

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Electronmicroscopy of biological and sensitive samples

Samples for electronmicroscopy should not containwater, because they are exposed to high vacuum in a high-resolution electronmicroscope and thewaterwould be rapidly released fromwet specimens. This would not only lead to their degradation, but also complicate the work of accelerated electrons, which would be colliding with molecules of water. Therefore it is necessary to modify the biological material that contains a high percentage of water, so that it does not store any water before observation under the microscope. There are several approaches how to prepare hydrated samples:

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New imaging methods of electronmicroscopy

 New imagingmethods of electronmicroscopy enable us to collectmore effectively complex data about thematerial in question,whichmeans data about chemical composition and crystalline and electronic structure.Microscopywith slowbackscattered electrons,whichwere emitted under high ngles with respect to the surface normal and therefore are not detected in the standard microscopes, offer substantially extended information contents.

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High resolution scanning electronmicroscopywith analytic techniques

The high resolution scanning electronmicroscopy applications are met in nearly all scientific branches. In combinationwith the X-raymicroanalysis, EBSD and cathodoluminescence it provides information about the surface topography of a sample, its crystalografic orientation and its local quantitative chemical composition.

Scanning electron microscopes:

  • FEI MAGELLAN 400
  • JEOL JSM 6700F
  • TESCAN VEGA 5130

Analysers:

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Consulting and training courses in safety in cryogenics

Risks in cryogenics are significant but are not immediately discernible. Persons working in this area must be well informed and must complete the appropriate courses. There is danger of serious injury (e.g. low temperature burns, mechanical injuries, asphyxiation). Almost all vessels for liquid gas storage are pressure vessels, which are subject to very strict regulations for manufacturing, handling and maintenance.

We offer consulting and training courses in these areas:

 

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Stationary magnetic fields

Long term research in the area of superconducting magnets for NMR spectroscopy has given us experience in the following fields:

 

  • Mapping of stray magnetic fields by Hall probes.
  • Precise measurement of homogeneous magnetic fields in the range 0.7 – 13.7 T applying the method of nuclear magnetic resonance.
  • Experimental assessment of the influence of stationary magnetic fields up to 4.7 T on developed technical systems.
  • Design and realisation of superconducting magnet systems with rotational symmetry.
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Vacuum technique

Long-term activities have given us practical knowledge in the following fields:

 

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