Microscopy and the analysis of very clean surfaces under ultrahigh vacuum conditions represent an irreplaceable tool for contemporary and, in particular, new nanotechnologies. ISI has built its own version of the ultrahigh vacuum scanning electron microscope for examination of atomically clean and defined or even in-situ prepared surfaces of solids. The microscope has an operational vacuum of 10–8 Pa thanks to its complete bakeability, but samples are readily exchanged via vacuum airlock.