Industry and Applications

Determination of thermal-radiation properties of materials

Radiation and the absorption attributes of surfaces play a substantial role in cryogenics and significantly affect the efficiency and operational cost of cryogenic systems. In many cases, it is necessary to eliminate parasitic thermal flux from “warm” to cold surfaces.

We perform:

 

  • The measurement of thermal dependences of material emissivity and absorptivity (samples of 40 mm in diameter) in the temperature range of 20 K – 300 K.
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Design and realisation of cryogenic systems

We have designed and manufactured many specialised cryogenic systems for a wide range of applications. We have projected both theoretical and experimental procedures (e.g. programs, tests, attribute verifying) leading up to the realisation of the specific system according to the customer's re­quirements.

We offer long term experience in these fields:

 

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Low temperature thermometry

In this field we use devices designed in the institute; these allow:

 

  • Temperature sensor calibration in the range of 1.4 K – 100 K, with an accuracy better than ± 16 mK by use of secondary temperature etalon.
  • Measurement of the thermal conductivity of materials and components in the temperature range of 10 K – 300 K. Samples up to 40 mm in diameter and up to 50 mm in length can be measured in the existing device. For larger samples it is possible to design and manufacture a new device according to the customer's needs.
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Electron microscopy under ultrahigh vacuum conditions

Microscopy and the analysis of very clean surfaces under ultrahigh vacuum conditions represent an irreplaceable tool for contemporary and, in particular, new nanotechnologies. ISI has built its own version of the ultrahigh vacuum scanning electron microscope for examination of atomically clean and defined or even in-situ prepared surfaces of solids. The microscope has an operational vacuum of 10–8 Pa thanks to its complete bakeability, but samples are readily exchanged via vacuum airlock.

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Environmental scanning electron microscopy and detection systems

The environmental scanning electron microscopy (ESEM) is a modern solution for the observation of any type of nonconductive objects without the necessity of coating with a metallic or carbon layer. In addition, wet samples of animate or inanimate origin can be preserved and observed close to their natural status.

 

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E-Beam Lithography Technology

The group of Electron Beam Lithography (EBL) within the Special technology department developed the E-beam lithography technology and Optical diffractive structures.

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Thin layers deposited by magnetron sputtering and their dynamic impact testing

We can deposit thin layers by high-frequency magnetron sputtering in the commercial equipment LEYBOLD-HERAEUS Z 550, enabling the production of layers in small series or on single substrates of up to 100 mm in diameter and a thickness of 20 mm. The machine is equipped with three magnetrons, each with a Ø152 mm target. This makes it possible to deposit three different materials in one evacuation cycle. For special applications (for example ion etching) the substrate can be pre-heated and electrically charged.

 

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Design and manufacture of feedthroughs

The team of Special technologies realizes research and manufacture of varies types of electric, vacuum-tight and high- or low- temperatures resistant feedthroughs. The technology is based on glass-to-metal seals, either with kovar or other metals (pressure-seals).The feedthroughs are usually welded to flanges or other construction components. To date we have developed the following types:

 

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Imaging and data analysis

ALISI is prepared to optimize the measurement and data processing protocols for answering specific questions and to carry out the necessary measurements. Due to the complexity of the technology and the enormous flexibility of NMR measurements, collaborative work may be the most suitable way to maximizing the synergy between the core competence of the client and the NMR competence of the ALISI teams.

MR imaging, localized spectroscopy and spectroscopic imaging

 

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