Research

The project aims at introducing in electron microscopes novel techniques responding to needs of nanotechnologies, development of advanced materials, and application of knowledge acquired in biology and medicine. This concerns imaging of crystals including 2D ones, non-conductive surfaces, imaging the wave-optical contrasts, etc. Novel materials, technologies of their processing and novel components of the scanning electron microscopes will be developed, accompanied with adequate methodology.

The project aims at introducing in electron microscopes novel techniques responding to needs of nanotechnologies, development of advanced materials, and application of knowledge acquired in biology and medicine. This concerns imaging of crystals including 2D ones, non-conductive surfaces, imaging the wave-optical contrasts, etc. Novel materials, technologies of their processing and novel components of the scanning electron microscopes will be developed, accompanied with adequate methodology.

Vysoce citlivé high-tech scintilační a scintilačně-ionizační detektory signálních elektronů pro rastrovací a environmentální rastrovací elektronové mikroskopy budou pomocí matematickofyzikálního modelování a Monte Carlo simulací zkoumány a při sdílení špičkových technologií a knowhow testovány a vyvíjeny. Výsledky projektu, vyznačující se špičkovou technologickou úrovní a vysokou přidanou hodnotou, staví na zkušenostech a účinné akademicko-firemní spolupráci a jsou určeny pro celosvětový trh.

The project aims at introducing in electron microscopes novel techniques responding to needs of nanotechnologies, development of advanced materials, and application of knowledge acquired in biology and medicine. This concerns imaging of crystals including 2D ones, non-conductive surfaces, imaging the wave-optical contrasts, etc. Novel materials, technologies of their processing and novel components of the scanning electron microscopes will be developed, accompanied with adequate methodology.

Detailed analysis of electron beam sensitive samples by scanning electron microscope (SEM) is in many cases the compromise between the quality of detected signal and the beam damage of the sample. The use of high currents, which are necessary for several analyses, causes destruction of the sample structure. To estimate the limit of significant damage formation it is possible to use quantitative evaluation of electron-sample interactions.

The project aims at introducing in electron microscopes novel techniques responding to needs of nanotechnologies, development of advanced materials, and application of knowledge acquired in biology and medicine. This concerns imaging of crystals including 2D ones, non-conductive surfaces, imaging the wave-optical contrasts, etc. Novel materials, technologies of their processing and novel components of the scanning electron microscopes will be developed, accompanied with adequate methodology.